Effective research in nanotechnology requires on-going flexibility in both AFM hardware and software. Whether your research involves the study of e-beam fabricated nanostructures or self-assembled nanoparticles, the flexible Dulcinea SPM control system and the famous WSxM software will allow your AFM to address any project that might arise.
- Nanogeometry Matters: Unexpected Decrease of Capillary Adhesion Forces with Increasing Relative Humidity
M.Kober, E.Sahagun, P.Garcia-Mochales, F.Briones, M.Luna, J.J.Saenz.Small-journal Vol. 6, N0. 23, 2725-2730(2010)
- Patterning of rutile TiO2 surface by ion beam lithography through full-solid masks
R. Sanz,M. Jaafar,M. Hernandez-Velez.Nanotechnology Vol. 21, Issue 3, 235301 (2010)
- Nanoporous alumina membrane prepared by nanoindentation and anodic oxidation
D. Navas, M. Hernandez-Velez, J.L. Baldonedo, M. Vazquez and A. Asenjo. Surface Science Vol. 603, N. 20, from 3155 to 3159 (2009)
- Single Photon Emission from Site-Controlled InAs Quantum Dots Grown
on GaAs(001) Patterned substrates
J. Martin-Sanchez, G. Muñoz-Matutano, J. Herranz, J. Canet-Ferrer, B. Alen, Y. Gonzalez,
P. Alonso-Gonzalez, D. Fuster, L. Gonzalez, J. Martinez-Pastor, and F. Briones. ACSNano Vol. 3, N. 6, 1513–1517 (2009)
- Quantitative Nanoscale Dielectric
Microscopy of Single-Layer Supported
Biomembranes
Laura Fumagalli, Giorgio Ferrari, Marco Sampietro, and Gabriel Gomila. Nanoletters (2009).
- Site-controlled lateral arrangements of
InAs quantum dots grown on GaAs(001)
patterned substrates by atomic force
microscopy local oxidation
nanolithography
J Martın-Sanchez, P Alonso-Gonzalez, J Herranz, Y Gonzalez and
L Gonzalez. Nanotechnology 20 (2009) 125302
- Chemical identification of individual surface atoms by atomic force microscopy
Yoshiaki Sugimoto et al. Nature 446 March 2007
- Quantitative analysis of tip–sample interaction in non-contact scanning force spectroscopy
J.Colchero. Nanotechnology 17, 5491- 5500 (2006)
- Enhanced mass sensing using torsional and lateral resonances in microcantilevers
L.B.Sharos et al. Applied Physics Letters 84, 4638-4640 (2004)
- Scanning force microscopy jumping and tapping modes in liquids
Moreno- Herrero et al. Applied Physics Letters 81, 2620-2622 (2002)
- Tip-sample interaction in tapping-mode scanning force microscopy
de Pablo et al. Physical Review B 61, 14 179-14 183 (2000)
- Study of tip–sample interaction in scanning force microscopy
M. Luna et al. Applied Surface Science 157 (2000) 285–289
