Radial Electromechanical Properties measured by Atomic Force Microscopy
Copyright Willey Interscience 2004
The image illustrating the cover of the 2004, March issue of Advanced Materials shows the electrical conductance of single-walled carbon nanotubes (SWNTs) as a function of the loading force and bias voltage applied by an atomic force microscope tip.
An increase of the conductance due to the tip-SWNT electrical contact formation and a drop of the conductance at high loading forces due to radial molecule deformation are observed.
C.Gómez-Navarro et-al. Advanced Materials volume 16 issue 6 (2004).
