E+MFM for independent and simultaneous Electrostatic and Magnetic measurements

Nanotec Electronica proudly announces the release of a new SPM technique: E+MFM.

E+MFM was introduced for the first time at the 2011 Fall Meeting of the MRS and received an enthusiastic response from conference attendees. E+MFM brings users a new tool for True MFM Imaging, capable of obtaining simultaneous and independent Electrostatic and Magnetic measurements. This new technique was developed at the Nanotec R&D Department in collaboration with ICMM-CSIC MFM experts and the UAM Nanoforces Group.

If you want to know more about our products please contact us.


- M.Jafaar et al, Beilstein J. Nanotechnology, 2011, 2 552-560.

- D. Martinez-Martin et al, Physical Review Letters 2010, 105, 257203.

Previous       Next
© 2014 Nanotec
Nanotec Electrónica