The Scanning Tunnelling Microscope (STM) is used to obtain atomic-scale images of metal and semiconductor surfaces. With three-dimensional profiles and a high resolution, it is a very useful technique to characterize molecular structures on surfaces and imaging individual atoms on the surfaces of materials.
Nanotec's Ambient STM Head is easily exchangeable with the AFM head, allowing easy combination of AFM and STM studies on the same sample. With all the possibilities that the WSxM software offers for the UHV STM systems, it is a very versatile tool for the study of conductive samples.
