WSxM v3.0 detailed features

Data Processing and Representation

  • Reading of new third party files.
    • DME.
    • Quesant.
    • Burleigh.
    • NT-MDT.
    • SPMLab 5.01.
    • grayscale TIF files.
    • SIESTA calculated LDOS files.
    • Morita lab.
    • Oxford Instruments.
    • Basel University Lollypop.
  • Improvements reading third party files from:
    • Freï Universitat Berlin.
    • ImageSXM.
    • di.
    • RHK.
    • Omicron.
    • Molecular Imaging.
    • LASUAM.
    • Topometrix.
    • Park Instruments.
  • General Data Processing improvements and new features:
    • More powerful and easy to use palette management.
    • Much more powerful and user friendly profiles creation and management.
    • New presentation for the curves with auto scaling.
    • More powerful and flexible file format for the images.
    • Recalibrate menu allowing to change X, Y and Z amplitude of your image.
    • Possibility of reading and writting of images in ASCII format.
    • Automatic scientific notation for too big or too small numbers.
    • Advanced toolbars management.
    • No to All option when being asked about saving modified images.
    • Possibility of representation of images with contour plots.
    • Gaussian smooth process.
    • Function Generator allowing to create images or perform custom processes.
    • Status bar for maximized dialogs.
    • Size requirements removed for movie creation from images.
    • Direct links from the about menu to Nanotec web site and WSxM support e-mail address.
    • New scalebar design.
  • Processes improved:
    • 1D-FFT for images (in the 2D-FFT menu).
    • PSD (Power Spectrum Density) process for images and profiles.
    • Profiles with influence radius.
    • Logarythm and Measure Distance available for IV curves.
    • Flooding process extension.
    • Possibility of creating windows with the FFT results.
    • Lattice process revision.
  • Ironed surface calculation in the Roughness Analysis menu.
  • New movies processes:
    • Rotate Angle.
    • Flooding.
    • Auto drift correction.
    • Particle Movement Analysis.
  • New CITS processes:
    • Subtract IV Offset.
    • Reverse IV Curves.
    • Replace Topo Image.
    • Expanded CITS view allowing to visualize all the current images.

Real Time Acquisition (only Nanotec Dulcinea or Cervantes users):

  • Compatibility:
    • Compatibility with C31, C32 and M6701 Digital Signal Processors.
    • Compatibility with Dulcinea High Voltage Unit.
  • General improvements for scanning time:
    • Arrow indicates the direction (up/down) of the scan.
    • Up to 17 different images can be simultaneously visualized during the acquisition.
  • Improvements available only for Dulcinea Control System users:
    • Smooth gains change.
    • Software control for the laser.
    • Possibility of applying 100Hz/10Hz filters to Z, Y and Z high voltage outputs.
    • High Voltage Bias (up to 150V) available.
    • Users can select the signals to monitor in the Dulcinea's front BNCs.
    • Software controlled Z Offset.
    • Output gains can be as small as 0.06.
    • Dynamic Gain Out gets separated in Gain Out X and Gain Out Y for Amplitude and Phase.
  • Scanning modes improved sustancially:
  • Other new features:
    • M6701 Digital Signal Processor users will have no transmission times between the scans.
    • Bias zero during IZ option.
    • Maximum drift correction parameter available in movies acquisition.
    • CITS acquisition can be performed acquiring any channel (not always current).
    • Number of acquired channels can be changed.
    • Logitech Wingman cordless joystick can be used to control laser (only for Dulcinea) and motor.
    • Complex way to save acquired curves simplified.
  • New Lithography part of the program allowing to design your experiment with a script language and graphic interface.
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