Main Features

Data Processing

Unlimited number of simultaneous processing images in your screen.
Friendly and powerful user interface.
Flexible and easy to use browser for all kind of data (Images, Movies, CITS, FZ, IZ,IV...).
All of the most common image processing filters: zoom, plane subtraction, smooth, matrix convolution...
Sophisticated data analysis, including dI/dV normalization, hole detection, line removal, non-linear correction...
2D profiles and 2D multiple image profiles.
Multiple dynamic zoom.
Tip convolution.
Surface and perimeter histograms with fractal analysis.
Roughness analysis.
FFT analysis, including window filtering.
Compatible with most of the SPM commercial file formats: Digital Instruments, Topometrix, Park Instruments, Omicron...
Powerful and intuitive 3d rendering
Full integration with Windows browser, such as drag and drop or Thumbnail preview.
Session management for continue working in the same state as saved in a previous time.
Mesh average.
Wavelet analysis.

Real time control based on Digital Signal Processor (DSP) technology.
Simultaneous acquisition and rendering of up to 17 images with different real time filters.
Any image can be seen as a pseudocolor map or oscilloscope mode.
Real time non linear correction for X-Y scan.
All the common modes for SxM:
- Contact mode.
- Dynamic Force Microscopy with Phase Lock Loop (PLL).
- FZs, IZs, IVs, ZVs,...
And new sophisticated working modes like:
- 4D-Spectroscopy (including Current Image Tunneling Spectroscopy (CITS) and Force Volume).
- Movie acquisition.
- Automatic drift compensation for all working modes.
- Digital acquisition of adhesion and stiffness maps simultaneously with the topography map using Jumping Mode.
- Up to 3 independent auxiliary feedback loops (useful for Kelvin Probe Microscopy).
- Close loops for X, Y and Z axis.
- Unique 3d modes, allowing acquisition of different image types like:
  - Current / Bias / Z
  - Normal Force / Frequency / Z
  - Lateral Force / Lateral Displacement / Z
  - Tunnel Current / Lateral Displacement / Bias
- Retrace mode allowing dual bias images, dual set point images and lift mode useful for Magnetic Force Microscopy.
- Plane scan.
- Lithography.
- Integrated view of the Optical microscope's image.
- Cordless controller for some actions (approach, switching laser, .)
- Interface with 3rd -Tech's Nanomanipulator.
- TTL trigger signals control.