Nanotec Electrónica S.L.
Nanotec Electrónica develops Scanning Probe Microscopes (SPM) with the best quality and the
latest technology in the field, providing both scientific and industrial communities easy access
to the nanometer scale.
Nanotec Electrónica also designs and manufactures control systems for
Scanning Probe Microscopes. In the software sector, we have developed the free WSxM software
for data visualization and processing of SPM images, and distribute the SIESTA DFT software
for first principle calculations.
News
Forthcomming Events - Nanotec will attend to Nanospain conference at Santander, Spain
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Product News - Prices Freezed at Nanotec
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Product News - New Data Acquisition Wizard of the famous software WSxM
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Product News - New versions of the famous software WSxM
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Product News - E+MFM for independent and simultaneous Electrostatic and Magnetic measurements
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Past Events - Nanotec Scanning Probe products stand out at the 2011 Fall Meeting of the MRS Conference in Boston, MA (USA)
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Publications Using Nanotec Equipment - Bioinspired Fibers Follow the Track of Natural Spider Silk
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Last Publication Covers
Copyright RSC Publishing 2010 Cover of the October 2010 issue of Soft Matter devoted to Nanotec Jumping Mode Plus.
M. Baclayon, et al. Soft Matter, 2010, Vol. 6, 5273-5285
Copyright Elsevier B.V. 2009 Cover of the May 2009 issue of Ultramicroscopy devoted to Variable Field Magnetic Force Microscopy.
M. Jaafar et al. Ultramicroscopy 109, 693-699 (2009)
Copyright Macmillan Publishers Ltd 2007. Cover of the 2007, 1st of March issue of Nature devoted to the chemical identification of individual atoms by atomic force microscopy.
Sugimoto et al. Nature 446, 64-67 (2007)
