Nanotec Electrónica S.L.

Nanotec Electrónica Nanotec Electrónica develops Scanning Probe Microscopes (SPM) with the best quality and the latest technology in the field, providing both scientific and industrial communities easy access to the nanometer scale.

Nanotec Electrónica also designs and manufactures control systems for Scanning Probe Microscopes. In the software sector, we have developed the free WSxM software for data visualization and processing of SPM images, and distribute the SIESTA DFT software for first principle calculations.

Join us on LinkedIn

News

Publications using Nanotec equipment - Cementing proteins provide extra mechanical stabilization to viral cages
More information


Publications using Nanotec equipment - Interplay between the mechanics of bacteriophage fibers and the strength of virus-host links
More information


Publications using Nanotec equipment - Imaging Molecular Orbitals of PTCDA on Graphene on Pt(111): Electronic Structure by STM and First-Principles Calculations
More information


Publications using Nanotec equipment - Solvent-Induced Delamination of a Multifunctional Two Dimensional Coordination Polymer
More information


Product News - Get the SPM specially designed for you: new set of Nanotec Electronica SPMs
More information


Product News - Exclusive discount in SPMs and Control Units for R&D purposes
More information


Company News - News events confirmed in 2014
More information


Small

 

Publication Covers

Small

 

Copyright John Wiley & Sons, Inc. 2012 Cover of the August issue of Small obteined with Cervantes FullMode AFM by Nanotec.

M. Hernando-Perez, et al. Small, August 6, 2012, Volume 8, Issue 15, page 2365

Soft Matter

 

Copyright 2011JPCC Cover of the June 2011 issue of Journal of Physical Chemistry C obteined with Nanotec System.

Antonio J. Martinez-Galera and Jose M. Gomez-Rodriguez, The Journal of Physical Chemistry, 2011, 115 (22), pp 11089-11094

Nature

Copyright Macmillan Publishers Ltd 2007. Cover of the 2007, 1st of March issue of Nature devoted to the chemical identification of individual atoms by atomic force microscopy.

Sugimoto et al. Nature 446, 64-67 (2007)



© 2014 Nanotec
Nanotec Electrónica