Nanotec Electrónica S.L.

Nanotec Electrónica develops Scanning Probe Microscopes (SPM) with the best quality and the latest technology in the field, providing both scientific and industrial communities easy access to the nanometer scale. Nanotec Electrónica also designs and manufactures control systems for Scanning Probe Microscopes. In the software sector, we have developed the free WSxM software for data visualization and processing of SPM images, and distribute the SIESTA DFT software for first principle calculations.

News

	Optimize your SPM results- NEW!!! If you work with a Cervantes FullMode AFM, a Dulcinea SPM Control System or a third party AFM system, we encourage you to read Nanotec AFM letters, to find the best solutions to improve your SPM results read more
Nanotec AFM Letters

Nanotec will be exhibiting at the ECOSS 27 European Conference on Surface Science in Groningen (Netherlands) from August 29 to September 3, 2010.

We will be showing Nanotec Cervantes AFM and measuring samples during all talks and exhibition times.

 

True atomic resolution on mica (001) in liquids with Frequency Modulation and Lanza AFM - NEW!!

               

Topography Image taken in FM-AFM

Scanning Speed = 440 nm/s

Topography image measured in FM-AFM. The arrow shows the detection of a vacant, demonstrating that the atomic resolution is True Atomic Resolution

Detailed Information

International Scanning Probe Microscope Image Prize 2009
More information

APPLICATION - The capillarity of nanometric water menisci confined inside closed-geometry viral cages More information

WSxM - Main features of WSxM v5.0 More information

PRODUCTS - WSxM GOLD PACKAGE More information

Last Publication Covers

Copyright Macmillan Publishers Ltd 2007. Cover of the 2007, 1st of March issue of Nature devoted to the chemical identification of individual atoms by atomic force microscopy.

Sugimoto et al. Nature 446, 64-67 (2007)