Nanotec Electrónica S.L.
Nanotec Electrónica develops Scanning Probe Microscopes (SPM) with the best quality and the
latest technology in the field, providing both scientific and industrial communities easy access
to the nanometer scale.
Nanotec Electrónica also designs and manufactures control systems for
Scanning Probe Microscopes. In the software sector, we have developed the free WSxM software
for data visualization and processing of SPM images, and distribute the SIESTA DFT software
for first principle calculations.
News
Forthcoming Events - Nanotec will be exhibiting at Nanofair 2012, Dresden, June 12 - 13
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Product News - New versions of the famous software WSxM
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Publications using Nanotec equipment - Cover of the Journal of Physical Chemistry C
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Product News - Jumping Mode +: AFM in liquids reaches a new horizon
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Product News - Eagle Scan: New Ultra-fast Data Acquisition Mode of the famous software WSxM
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Product News - New Data Acquisition Wizard of the famous software WSxM
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Product News - E+MFM for independent and simultaneous Electrostatic and Magnetic measurements
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Last Publication Covers
Copyright 2011JPCC Cover of the June 2011 issue of Journal of Physical Chemistry C obteined with Nanotec System.
Antonio J. Martinez-Galera and Jose M. Gomez-Rodriguez, The Journal of Physical Chemistry, 2011, 115 (22), pp 11089-11094
Copyright RSC Publishing 2010 Cover of the October 2010 issue of Soft Matter devoted to Nanotec Jumping Mode Plus.
M. Baclayon, et al. Soft Matter, 2010, Vol. 6, 5273-5285
Copyright Macmillan Publishers Ltd 2007. Cover of the 2007, 1st of March issue of Nature devoted to the chemical identification of individual atoms by atomic force microscopy.
Sugimoto et al. Nature 446, 64-67 (2007)
